Abstracts of the conference “Electron Microscopy and Multiscale Materials Modeling"сборник
Статьи, опубликованные в сборнике
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2007
Resonant diffraction of X-rays as a probe for structural, electronic, and phononic properties
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Dmitrienko V.E.,
Ovchinnikova E.N.,
Kolchinskaya А.М.,
Oreshko A.P.,
Kokubun J.,
Ishida K.,
Mukhamedzhanov E.
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в сборнике Abstracts of the conference “Electron Microscopy and Multiscale Materials Modeling", место издания Moscow, тезисы, с. 167-167