Abstracts of the XI International Conference on Small-Angle Scattering. May 17–20, 1999сборник

Статьи, опубликованные в сборнике

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• • 1999 New Way of Solid State Domain Characterization in Silicon Carbide and Gallium Nitride
  • Boiko M.E.
  • в сборнике Abstracts of the XI International Conference on Small-Angle Scattering. May 17–20, 1999, серия Brookhaven National Laboratory, место издания Upton, New York, USA,, тезисы
• • 1999 SAS X-Ray Study of Ultradispersed Metal Oxides Impregnated into the SiO2 Porous Matrices . May 17–20, 1999. – Upton, New York, USA, 1999. [Brookhaven National Laboratory.]
  • Boiko M.E., Beger V.N., Plechakov I.V.
  • в сборнике Abstracts of the XI International Conference on Small-Angle Scattering. May 17–20, 1999, серия Brookhaven National Laboratory, место издания Upton, New York, USA,, тезисы