2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)сборник

Статьи, опубликованные в сборнике

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  • 2017 On the fault coverage of high-level test derivation methods for digital circuits
  • López J., Vinarsky E., Laputenko A.
  • в сборнике 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), с. 184-189