2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)сборник

Статьи, опубликованные в сборнике

---

• 
  • 2018 Testing Digital Circuits: Studying the Increment of the Number of States and Estimating the Fault Coverage
  • Vinarskii E., Laputenko A., López J., Kushik N.
  • в сборнике 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), с. 6403-6408 DOI