2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)сборник

Статьи, опубликованные в сборнике

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  • 2019 Experimental Evaluation of Timed Finite State Machine Based Test Derivation
  • Tvardovskii A.S., Vinarskii E.M., Yevtushenko N.V.
  • в сборнике 2019 20th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), с. 102-107 DOI