Proc. 3rd European Symposium “X-Ray Topography and High Resolution Diffraction” (Palermo, Italy, 22-24 April 1996), P. 49сборник

Статьи, опубликованные в сборнике

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• • 1996 An advanced X-ray HRD studies of microdefects in Si doped GaAs bulk crystal
  • Lomov A.A., Bushuev V.A., Franzosi P., Bocchi C., Imamov R.M.
  • в сборнике Proc. 3rd European Symposium “X-Ray Topography and High Resolution Diffraction” (Palermo, Italy, 22-24 April 1996), P. 49, место издания Rome, тезисы, с. 49-49