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This report presents the results of transport critical current and magnetization measurements of 2G HTS wires with different architecture of the HTS layer. A series of MOCVD-YBCO samples on IBAD-textured templates have been prepared. The samples differed in the architecture of the HTS layer: (1) monolithic YBCO layer, (2) multiple 200-300 nm thick YBCO layers interleaved with epitaxial 20 nm thick Y2O3 layers, and (3) three YBCO layers interleaved with two epitaxial 20 nm thick Y2O3 layers. The overall thickness of all YBCO layers in each architecture type was approximately 2 microns. Transport critical current measurements at 77 K showed that the multi-layered samples had higher Jc in magnetic field and different in-field angular anisotropy of Jc than the monolithic samples. Based on magnetization measurements in the 5-77 K temperature range, we calculated Jc values at T < 77 K, as well as Jc temperature and magnetic field dependences. The correlations between the Jc values and behavior and the YBCO layer epitaxial quality, morphology and microstructure studied with XRD, SEM and TEM are discussed.