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We present an investigation of carbon-silver composite thin films obtained by pulsed ion-assisted sputtering. Transmission electron microscopy showed that the films consist of amorphous carbon matrix and silver nanoclusters. The increase of assisting ions energy from 0 eV to 300 eV results in decrease of silver nanoclusters size and in their size distribution broadening while their content rises. Amorphous carbon films containing silver nanoclusters with controlled size are promising for numerous applications, for example surface-enhanced Raman spectroscopy