ИСТИНА

Considerable research efforts are currently invested in finding new materials for electrochemical applications. One new type of such a material is MXene. The using in electrochemical applications require knowledge of the physical and chemical characteristics of the material [1, 2]. The aim of our work is to study the fundamental parameters of MXenes. In this work, the object of study is the layered structure of the composition Ti2CTx, where Tx are the functional groups –Al, –O, –OH, –F. The method of X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and energy dispersive X-ray spectroscopy (EDS) used to study changes in the chemical bond and elemental composition of the samples. X-ray analysis studied changes in structure of samples. Atomic force microscopy used to study the surface topography of the samples. Scanning electron microscopy used to study the changes morphology of the samples. The study of the local atomic structure of the samples was carried out using the XAFS-like method, by analyzing the Extended Electron Energy Loss Fine Structure (ExEELFS). Experimental titanium spectra (М2,3 ExEELFS) of were obtained. Electron energy loss spectra were obtained in backscattering geometry of the secondary electrons from the sample surface with Auger microanalyzer JAMP-10S (JEOL). The parameters of the local atomic structure of the sample are determined: partial interatomic distances, coordination numbers, parameters of thermal dispersion of atoms. Acknowledgement The work was carried out according to the plan of scientific research with partial financial support of the project №121030100002-0. The work was carried out using the equipment of the Center for Physical and Physical-Chemical Methods of Analysis, Research of Properties and Characteristics of Surfaces, Nanostructures, Materials and Products of the UdmFRCUrB RAS.