Space radiation environment prediction for VLSI microelectronics devices onboard a LEO satellite using OMERE-TRAD softwareстатья
Информация о цитировании статьи получена из
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Дата последнего поиска статьи во внешних источниках: 10 октября 2015 г.
Аннотация:inclinations was modeled in the form of electrons and protons trapped in Van Allen Earth Radiation Belts (ERBs), heavy ions and protons
in Galactic Cosmic Rays (GCRs), and Energetic Solar Particles (ESP) Events during solar maximum period. The co-relation
between various shielding thicknesses and particles transport flux was analyzed for this specific orbit. We observed that there is an
optimum shield thickness above which the attenuation of the transmitted flux of incident particles is negligible. To estimate the orbit
average differential and integral fluxes to be encountered by onboard devices an appropriate radiation environment models were chosen
in OMERE-TRAD toolkit and the impact of various shielding thickness for different orbital inclinations on integral
Linear-Energy-Transfer (LET) spectra were determined.