Аннотация:General phenomena allowing one to connect x-ray absorption coefficient and electron yield of substance are analyzed. A series of developed laboratory x-ray spectrometers based on rotating anode radiation and aimed at XAFS (x-ray absorption fine structure) measuring are described. Basic schemes of these devices are considered. Particular examples of using the devices for XAFS registration and following substance analysis are demonstrated.
Precision Instrument and Mechanology(PIM)
ISSN:2304-1811(Print)
ISSN:2304-182X(Online)
Website: www.academicpub.org/pim/