|
ИСТИНА |
Войти в систему Регистрация |
ИСТИНА ИНХС РАН |
||
Time-resolved ion spectrometry on xenon with the jitter-compensated soft x-ray pulses of a free-electron laserстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
- Авторы: Krikunova Maria, Maltezopoulos Theophilos, Azima Armin, Schlie Moritz, Fruehling Ulrike, Redlin Harald, Kalms Roland, Cunovic Stefan, Kabachnik Nikolay M., Wieland Marek, Drescher Markus
- Журнал: New Journal of Physics
- Том: 11
- Год издания: 2009
- Издательство: IOP Publishing
- Местоположение издательства: [Bristol, UK], England
- Первая страница: 123019-1
- Последняя страница: 123019-13
- DOI: 10.1088/1367-2630/11/12/123019
- Аннотация: Atomic inner-shell relaxation dynamics were measured at the free-electron laser in Hamburg, FLASH, delivering 92 eV pulses. The decay of 4d core holes created in xenon was followed by detection of ion charge states after illumination with delayed 400 nm laser pulses. A timing jitter of the order of several hundred femtoseconds between laser- and accelerator-pulses was compensated for by a simultaneous delay measurement in a single-shot x-ray/laser cross-correlator. After sorting of the tagged spectra according to the measured delays, a temporal resolution equivalent to the pulse duration of the optical laser could be established. While results on ion charge states up to Xe(4+) are compatible with a previous study using a high-harmonic soft x-ray source, a new relaxation pathway is opened by the nonlinear excitation of xenon atoms in the intense free-electron laser light field, leading to the formation of Xe(5+).
- Добавил в систему: Кабачник Николай Мартинович