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3D visualization of XFEL beam focusing properties using LiF crystal X-ray detectorстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 11 января 2016 г.
- Авторы: Pikuz T., Faenov A., Matsuoka T., Matsuyama S., Yamauchi K., Ozaki N., Albertazzi B., Inubushi Y., Yabashi M., Tono K., Sato Y., Yumoto H., Ohashi H., Pikuz S., Grum-Grzhimailo A.N., Nishikino M., Kawachi T., Ishikawa T., Kodama R.
- Журнал: Scientific reports
- Том: 5
- Год издания: 2015
- Издательство: Nature Publishing Group
- Местоположение издательства: United Kingdom
- Первая страница: 17713
- DOI: 10.1038/srep17713
- Аннотация: Here, we report, that by means of direct irradiation of lithium fluoride a (LiF) crystal, in situ 3D visualization of the SACLA XFEL focused beam profile along the propagation direction is realized, including propagation inside photoluminescence solid matter. High sensitivity and large dynamic range of the LiF crystal detector allowed measurements of the intensity distribution of the beam at distances far from the best focus as well as near the best focus and evaluation of XFEL source size and beam quality factor M^2. Our measurements also support the theoretical prediction that for X-ray photons with energies ~10 keV the radius of the generated photoelectron cloud within the LiF crystal reaches about 600 nm before thermalization. The proposed method has a spatial resolution ~ 0.4–2.0 μm for photons with energies 6–14 keV and potentially could be used in a single shot mode for optimization of different focusing systems developed at XFEL and synchrotron facilities.
- Добавил в систему: Грум-Гржимайло Алексей Николаевич