Solid state features of electrocrystallized tungstate filmsстатья
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Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Авторы:
Plyasova L.M. ,
Molina I.Yu ,
Kustova G.N.,
Rudina N.A. ,
Borzenko M.I. ,
Tsirlina G.A. ,
Petrii O.A.
Журнал:
Journal of Solid State Electrochemistry
Том:
9
Номер:
5
Год издания:
2005
Издательство:
Springer Verlag
Местоположение издательства:
Germany
Первая страница:
371
Последняя страница:
379
DOI:
10.1007/s10008-004-0642-6
Аннотация:
X-ray diffraction, scanning electron microscopy, and infra-red spectroscopy are applied to study the evolution of films electrodeposited from acidic tungstate solutions. Structural inhomogeneity is found to be responsible for the difference in rechargeability of films of different thickness. Voltammetric responses demonstrate pronounced sensitivity to the nature of crystalline phases, thus throwing light on the defects of the lattice features of nonstoichiometric W(V)-W(VI) oxides. One crystalline phase observed in the films under study and attributed to the layered nonstoichiometric oxohydroxide was never reported for oxotungstate films fabricated by other techniques. This phase is believed to be special to electrocrystallized films and to keep some structural features of dissolved isopolytungstate molecular precursors. © Springer-Verlag 2005.
Добавил в систему:
Борзенко Марина Игоревна