Procedure for Modeling the Distribution of Doping Components Using Data from X-Ray Diffraction Experimentsстатья
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 26 августа 2016 г.
Аннотация:An X-ray diffraction procedure is proposed for modeling the distribution of components in the
depth of an alloy by analyzing the integral intensity, shape, and width of diffraction peaks of two orders of reflection. The procedure is used to refine data on the phase composition and distribution of indium atoms in the depth of hydrogenised Pd–In–Ru alloy after its long-term relaxation.