Second-harmonic confocal microscopy of layered microstructures based on porous siliconстатья
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Layered structures based on porous silicon have been studied by confocal microscopy of the second optical harmonic. A linear increase in the second-harmonic intensity with increasing porosity of the layers has been observed. This behavior may result from spatial fluctuations in the dipole quadratic response of the pore walls.