Characterization of CeO2 thin films on a sapphireстатья
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Thin layers of CeO2 were deposited on the R-plane of a sapphire substrate. The films were tested by x-ray diffraction, scanning electron microscopy and transmission electron microscopy techniques. The films were found to be epitaxial with fine-grain morphology of the surface. (C) 1998 Academic Press.