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Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer opticsстатья
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 15 февраля 2024 г.
- Авторы: Artyukov I.A., Feschenko R.M., Vinogradov A.V., Bugayev Ye A., Devizenko O.Y., Kondratenko V.V., Kasyanov Yu S., Hatano T., Yamamoto M., Saveliev S.V.
- Журнал: Micron
- Том: 41
- Номер: 7
- Год издания: 2010
- Издательство: Pergamon Press Ltd.
- Местоположение издательства: United Kingdom
- Первая страница: 722
- Последняя страница: 728
- DOI: 10.1016/j.micron.2010.06.011
- Аннотация: The high transparency of carbon-containing materials in the spectral region of “carbon window” (λ ∼ 4.5–5 nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5 nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd–glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.
- Добавил в систему: Артюков Игорь Анатольевич