Analysis of the scattering properties of nonaxiosymmetric substrate defects by the discrete sources methodстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 15 января 2015 г.
Аннотация:The discrete source method is generalized to the case of studying the scattering of polarized light radiation by nonaxisymmetric nanosize substrate defects. Scattering properties of line pits and bumps are analyzed within the framework of a common mathematical model using a “fictitious” particle. Results of the numerical experiment are presented.