Employing Fictitious Particles for Analysis of Scattering Properties of Undistinguished Substrate Defectsстатья
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Дата последнего поиска статьи во внешних источниках: 31 октября 2014 г.
Аннотация:Modification of the Discrete Sources Method based on employing of “fictitious” particle is suggested and performed. This approach allows one to perform an effective numerical analysis of the scattering properties of nanodimensional substrate defects, such as shallow pits and shallow bumps. Numerical results that demonstrate the capabilities of the implemented computer module are presented.