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Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing wavesстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 2 апреля 2015 г.
- Авторы: Shcherbina M.A., Chvalun S.N., Ponomarenko S.A., Kovalchuk M.V.
- Журнал: Russian Chemical Reviews
- Том: 83
- Номер: 12
- Год издания: 2014
- Издательство: Turpion - Moscow Ltd.
- Местоположение издательства: United Kingdom
- Первая страница: 1091
- Последняя страница: 1119
- Аннотация: The review concerns modern experimental methods of structure determination of thin films of different nature. The methods are based on total reflection of X-rays from the surface and include X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Their potential is exemplified by the investigations of various organic macromolecular systems that exhibit the properties of semiconductors and are thought to be promising as thin-film transistors, light-emitting diodes and photovoltaic cells. It is shown that combination of the title methods enable high-precision investigations of the structure of thin-film materials and structure formation in them, i.e., it is possible to obtain information necessary for improvement of the operating efficiency of elements of organic electronic devices.
- Добавил в систему: Ковальчук Михаил Валентинович