Isothermal crystallization of Ge2Sb2Te5 amorphous thin films and estimation of information reliability of PCM cellsстатья
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Дата последнего поиска статьи во внешних источниках: 17 октября 2017 г.
Аннотация:The statistical approach based on Kolmogorov's theory of metal solidification is used as the basis for a prediction of data retention time in phase change memory devices as a function of temperature of an active medium. We compared the results of theoretical simulation with the experimental results of isothermal annealing of Ge2Sb2Te5 thin films with various time and temperature regimes, and good agreement between the theoretical and experimental results was found