Comparison of Deep Learning Methods for Solving the Phase Problem in X-Ray Diffraction Analysisстатья
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Дата последнего поиска статьи во внешних источниках: 4 марта 2026 г.
Аннотация:An approach is proposed that can allow ab initio solution of the phase problem in X-ray diffractionstudies. A synthetic diffraction data generator has been created that can be used to solve applied problemsusing machine learning. An automated container is presented that allows reproducible experiments aimed atsolving the problem within the framework of the proposed approach. The FFT_UNet and XRD_Trans-former models were developed, taking into account the physical specifics of the problem, and a comparativeanalysis and interpretation of their work on real data were carried out.