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Тезисы докладов
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- 2016 In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector
- Pikuz T., Faenov A., Matsuoka T., Albertazzi B., Ozaki N., Hartely N., Muray Ricardo Arturo O., Yabuuchi T., Habara H., Matsuyama S., Yamauchi K., Inubushi Y., Togashi T., Yumoto H., Tange Y., Tono K., Sato Y., Yabashi M., Nishikino M., Kawachi T., Mitrofanov A., Bleiner D., Grum-Grzhimailo A., Rosanov N.N., Vysotina N.V., Harmand M., Koenig M., Tanaka K.A., Ishikawa T., Kodama R.
- в сборнике 15th International Conference on X-Ray Lasers 2016. Conference Program and Book of Abstracts. May 22nd - 27th, 2016 Nara Kasugano International Forum, Iraka, Japan, тезисы, с. 75-75