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Статьи в журналах
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- 2020 Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals
- Romanov D.A., Prokhorov I.A., Voloshin A.E., Kosushkin V.G., Bolshakov A.P., Ralchenko V.G.
- в журнале Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, издательство Pleiades Publishing, Ltd (Road Town, United Kingdom), том 14, № 6, с. 1113-1120 DOI
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- 2016 The Micro and Nano- defects Formation during Czochralski Growth
- Kosushkin V.G., Kozhitov L.V., Kaplunov I.A.
- в журнале Journal of Nano- and Electronic Physics, том 8, № 3, с. 03054 DOI
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- 2008 STRUCTURES OF THE CUBIC AND RHOMBOHEDRAL HIGH-PRESSURE MODIFICATIONS OF SILICON AS PACKING OF THE ROD-LIKE SUBSTRUCTURES DETERMINED BY THE ALGEBRAIC GEOMETRY
- Kraposhin V.S., Kosushkin V.G., Ogneva A.A., Talis A.L., Zinober L.I.
- в журнале Acta Crystallographica Section B: Structural Science, издательство Blackwell Publishing Inc. (United Kingdom), том 64, с. 26-33