ИСТИНА

Gusev E.E.

Соавторы: Дедкова А.А., Djuzhev N.A., Makhiboroda M.A., Tovarnov D.A., Демин Г.Д., Glagolev P.Y., Дюжев Н.А., Bakun A.D., Fomichev M.Y., Glagolev P.Y., Kirilenko E.P., Migunov D.M., Novak A.V. показать полностью..., Novak V.R., Onufrienko A.P., Patiukov N., Patyukov N.N., Preobrazhensky R.Y., Presnukhina A.A., Skvortsov P.A., Stepanov P.A., Грязнева Т.А., Киреев В.В., Киреев В.Ю., Лычев С.А., Попков А.Ф., Штерн М.Ю.

14 статей

Количество цитирований статей в журналах по данным Web of Science: 8, Scopus: 14

IstinaResearcherID (IRID): 304522169

Деятельность

• Статьи в журналах

  • • 2022 Peculiarities of deformation of round thin-film membranes and experimental determination of their effective characteristics
    • Dedkova A.A., Glagolev P.Y., Gusev E.E., Djuzhev N.A., Kireev V.Y., Lychev S.A., Tovarnov D.A.
    • в журнале Technical Physics, издательство Maik Nauka/Interperiodica Publishing (Russian Federation), том 92, № 13 DOI
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    • 2020 Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph
    • Djuzhev N.A., Gusev E.E., Dedkova A.A., Tovarnov D.A., Makhiboroda M.A.
    • в журнале Technical Physics, издательство Maik Nauka/Interperiodica Publishing (Russian Federation), том 65, № 11, с. 1755-1759 DOI
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    • 2020 Fast Nondestructive Technique for Analyzing Deflection of Membranes Located on the Substrate
    • Dedkova A.A., Dyuzhev N.A., Gusev E.E., Shtern M.Yu
    • в журнале Russian Journal of Nondestructive Testing, издательство Maik Nauka/Interperiodica Publishing (Russian Federation), том 56, № 5, с. 452-459 DOI
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    • 2018 Dependence of Mechanical Stresses in Silicon Nitride Films on the Mode of Plasma-Enhanced Chemical Vapor Deposition
    • Novak A.V., Novak V.R., Dedkova A.A., Gusev E.E.
    • в журнале Semiconductors, издательство Springer (New York), том 52, № 15, с. 1953-1957 DOI
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    • 2017 Development and study of a conceptual model of an X-ray source with a field emission cathode
    • Djuzhev N.A., Makhiboroda M.A., Preobrazhensky R.Y., Demin G.D., Gusev E.E., Dedkova A.A.
    • в журнале Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, издательство Pleiades Publishing, Ltd (Road Town, United Kingdom), том 11, № 2, с. 443-448
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    • 2017 Fabrication and Study of Parameters and Properties of Nanostructured Membranes for MEMS Devices
    • Dyuzhev N.A., Gusev E.E., Gryazneva T.A., Dedkova A.A., Dronova D.A., Kireev V.Y., Kirilenko E.P., Migunov D.M., Novikov D.V., Patyukov N.N., Presnukhina A.A., Bakun A.D., Ermakov D.S.
    • в журнале Nanotechnologies in Russia, том 12, № 7-8, с. 426-437 DOI

• Статьи в сборниках

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    • 2021 Development of Adhesive Wafer Bonding Technology
    • Fomichev M.Y., Makhiboroda M.A., Djuzhev N.A., Dedkova A.A., Gusev E.E.
    • в сборнике Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2021, серия IEEE, с. 2558-2562 DOI
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    • 2021 Experimental Study Mechanical Stresses and Strength in Multilayer PECVD SiO2
    • Gusev E.E., Tovarnov D.A., Dedkova A.A., Onufrienko A.P., Djuzhev N.A.
    • в сборнике Conference of Russian Young Researchers in Electrical and Electronic Engineering, ElConRus 2021, серия IEEE, с. 2437-2441 DOI
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    • 2020 Investigation of Mechanical Strength of Membrane Structure Consisting of Al/SiO2/Al
    • Gusev E.E., Tovarnov D.A., Dedkova A.A., Djuzhev N.A.
    • в сборнике IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering, EIConRus 2020, серия IEEE, с. 2299-2302 DOI
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    • 2020 Mechanical Stresses Analysis of Thin Round Membranes in the Case of Large Deflections
    • Dedkova A.A., Glagolev P.Yu, Demin G.D., Gusev E.E., Skvortsov P.A.
    • в сборнике Proceedings of the 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus), место издания St. Petersburg Electrotechnical University “LETI” Saint Petersburg, с. 2288-2292 DOI
  • • 2018 Non-destructive method of surface mapping to improve accuracy of mechanical stresses measurements
    • Djuzhev N.A., Gusev E.E., Dedkova A.A., Makhiboroda M.A.
    • в сборнике 6TH INTERNATIONAL CONFERENCE: MODERN TECHNOLOGIES FOR NON-DESTRUCTIVE TESTING, серия IOP Conference Series-Materials Science and Engineering, место издания IOP PUBLISHING LTD [Djuzhev, N. A.; Gusev, E. E.; Dedkova, A. A.] Natl Res Univ Elect Technol MIET, R&D Ctr MST & BEC, Moscow, Russia. [Makhiboroda, M. A.] Natl Res Univ Elect Technol MIET, NMST, Moscow, Russia, том 289 DOI
  • • 2017 Non-Contact Technique for Determining the Mechanical Stress in thin Films on Wafers by Profiler
    • Djuzhev N.A., Dedkova A.A., Gusev E.E., Makhiboroda M.A., Glagolev P.Y.
    • в сборнике 5TH INTERNATIONAL CONFERENCE: MODERN TECHNOLOGIES FOR NON-DESTRUCTIVE TESTING, серия IOP Conference Series-Materials Science and Engineering, место издания IOP PUBLISHING LTD [Djuzhev, N. A.] Natl Res Univ Elect Technol MIET, R&D Ctr MST & BEC, Moscow, Russia. [Dedkova, A. A.; Gusev, E. E.; Makhiboroda, M. A.; Glagolev, P. Y.] Natl Res Univ Elect Technol MIET, NMST, Moscow, Russia, том 189 DOI
  • • 2016 Compact HSPICE model of magnetic tunnel junction based on voltage-driven spin-transfer torque
    • Demin G.D., Gusev E.E., Popkov A.F., Stepanov P.A., Djuzhev N.A.
    • в сборнике SIBCON 2016 - Proceedings, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States)
  • • 2016 Determination of mechanical stress in the silicon nitride films with a scanning electron microscope
    • Djuzhev N.A., Gusev E.E., Dedkova A.A., Patiukov N.
    • в сборнике INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2016, серия Proceedings of SPIE, место издания SPIE-INT SOC OPTICAL ENGINEERING [Djuzhev, N. A.; Gusev, E. E.; Dedkova, A. A.; Patiukov, N.] Natl Res Univ Elect Technol, Shokina Sq 1, Moscow 124498, Zelenograd, Russia, том 10224 DOI