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Morphology of Anodic Alumina Films Obtained by Hard Anodization: Influence of the Rate of Anodization Voltage Increaseстатья
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 28 июня 2016 г.
- Авторы: Roslyakov I.V., Kuratova N.S., Koshkodaev D.S., Hermida-Merino D., Lukashin A.V., Napolskii K.S.
- Журнал: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
- Том: 10
- Номер: 1
- Год издания: 2016
- Издательство: Pleiades Publishing, Ltd
- Местоположение издательства: Road Town, United Kingdom
- Первая страница: 191
- Последняя страница: 197
- DOI: 10.1134/S1027451016010298
- Аннотация: The influence of the anodization voltage ramp on the morphology and thickness homogeneity of porous anodic alumina films was studied. The samples were prepared in the oxalic acid at 120 V during the hard anodization process. As a nondestructive characterization method, the small-angle X-ray scattering technique was used. The analysis of diffraction patterns allows determining the mean value and dispersion of interpore distance and the channel tortuosity with high accuracy. The increase of voltage ramp at the initial stage of hard anodization process was shown to lead to reduction of mechanical deformation (tortuosity) of anodic alumina film during crystallization.
- Добавил в систему: Росляков Илья Владимирович