Review of Scientific Instrumentsжурнал

Редколлегия

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• Образцов Александр Николаевич, 1 января 2011 - 31 декабря 2013

Статьи, опубликованные в журнале

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  • 2020 An improved parametric model for hysteresis loop approximation
  • Lapshin R.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 91, № 6, с. 1-31 DOI
• • 2020 Thermionic microwave gun for terahertz and synchrotron light sources
  • Kutsaev S.V., Agustsson R., Berry R., Borland M., Chao D., Chimalpopoca O., Gavryushkin D., Gusarova M., Hartzell J., Meyer D., Nassiri A., Smirnov A.Y., Smith T., Sun Y., Verma A., Waldschmidt G., Zholents A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 91, № 4 DOI
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  • 2019 Backscattered electron detector for 3D microstructure visualization in scanning electron microscopy
  • Rau E.I., Karaulov V.Yu, Zaitsev S.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, № 2, с. 023701 DOI
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  • 2019 Characteristics of miniature pulsed penning ion source: Experiment and PIC simulation
  • Mamedov N.V., Rohmanenkov A.S., Zverev V.I., Maslennikov S.P., Solodovnikov A.A., Uzvolok A.A., Yurkov D.I.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, № 12, с. 123310-1-123310-5 DOI
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  • 2019 Characterization of high spatial resolution lithium fluoride X-ray detectors
  • Mabey P., Albertazzi B., Michel Th, Rigon G., Makarov S., Ozaki N., Matsuoka T., Pikuz S., Pikuz T., Koenig M.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, № 6, с. 063702
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  • 2019 Gamma-ray imaging with a time-modulated random coded aperture
  • Wang D., Ruskov I.N., Huasi Hu H., Kopatch Y.N., Grozdanov D.N., Fedorov N.A., Aliyev F.A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, с. 015107 DOI
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  • 2019 Inertial motor on a single piezoelectric actuator for a low-temperature near-field scanning optical microscope
  • Mishakov G.V., Demikhov E.I., Sharkov A.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, № 1, с. e016103 DOI
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  • 2019 The vacuum arc ion source for indium and tin ions implantation into phase change memory thin films
  • Seleznev Dmitry, Kozlov Alexander, Kulevoy Timur, Sitnikov Alexey, Lazarenko Petr, Vorobyov Yuri, Smayev Mikhail, Yakubov Alexey, Sherchenkov Alexey, Kozyukhin Sergey
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 90, № 12, с. 123313
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  • 2018 Note: Additionally refined new possibilities of plasma probe diagnostics
  • Riaby V.A., Savinov V.P., Masherov P.E., Yaknin V.G.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 89, с. 036102 DOI
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  • 2018 The method of UCN “small heating” measurement in the big gravitational spectrometer (BGS) and studies of this effect on Fomblin oil Y-HVAC 18/8
  • Nesvizhevsky V.V., Voronin A.Yu, Lambrecht A., Reynaud S., Lychagin E.V., Muzychka A.Yu, Nekhaev G.V., Strelkov A.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 89, № 2, с. 023501 DOI
• • 2017 Heavy ion linear accelerator for radiation damage studies of materials
  • Kutsaev S.V., Mustapha B., Ostroumov P.N., Nolen J., Barcikowski A., Pellin M., Yacout A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 88, № 3 DOI
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  • 2017 Measurement of fluctuations of electrostatic force acting between a dielectric plate and an electrostatic drive
  • Koptsov D.V., Prokhorov L.G., Mitrofanov V.P.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 88, № 4, с. 044701 DOI
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  • 2017 Radio frequency source of a weakly expanding wedge-shaped xenon ion beam for contactless removal of large-sized space debris objects
  • Balashov V.V., Cherkasova M.V., Kruglov K.I., Kudriavtsev A.V., Masherov P.E., Mogulkin A.I., Obukhov V.A., Riaby V.A., Svotina V.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 88, № 083304, с. 083304-1-083304-5 DOI
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  • 2017 Two-probe atomic-force microscope manipulator and its applications
  • Zhukov A.A., Stolyarov V.S., Kononenko O.V.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 88, № 063701 DOI
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  • 2016 A comparative study of LaBr3(Ce3+) and CeBr3 based gamma-ray spectrometers for planetary remote sensing applications
  • Kozyrev A., Mitrofanov I., Owens A., Quarati F., Benkhoff J., Bakhtin B., Fedosov F., Golovin D., Litvak M., Malakhov A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 8, с. 085112 DOI
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  • 2016 Circular dichroism measurements at an x-ray free-electron laser with polarization control
  • Hartmann G., Lindahl A.O., Knie A., Hartmann N., Lutman A.A., MacArthur J.P., Shevchuk I., Buck J., Galler A., Glownia J.M., Helm W., Huang Z., Kabachnik N.M., Kazansky A.K., Liu J., Marinelli A., Mazza T., Nuhn H.D., Walter P., Viefhaus J., Meyer M., Coffee R.N., Ilchen M.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, с. 083113-1-083113-6
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  • 2016 Commissioning of the PRIOR proton microscope
  • Varentsov D., Antonov O., Bakhmutova A., Barnes C.W., Bogdanov A., Danly C.R., Efimov S., Endres M., Fertman A., Golubev A.A., Hoffmann D.H.H, Ionita B., Kantsyrev A., Krasik Ya E., Lang P.M., Lomonosov I., Mariam F.G., Markov N., Merrill F.E., Mintsev V.B., Nikolaev D., Panyushkin V., Rodionova M., Schanz M., Schoenberg K., Semennikov A., Shestov L., Skachkov V.S., Turtikov V., Udrea S., Vasylyev O., Weyrich K., Wilde C., Zubareva and A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 2, с. 023303-1-023303-8 DOI
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  • 2016 Erratum: “Mixed Pierce-two-stream instability development in an extraction system of a negative ion source” [Rev. Sci. Instrum. 87, 02A509 (2016)]
  • Barminova H.Y., Chikhachev A.S.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 4, с. 049902 DOI
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  • 2016 Erratum: “Oscillatory instability development in extraction system of a negative ion source” [Rev. Sci. Instrum. 87, 02A508 (2016)]
  • Barminova H.Y., Chikhachev A.S.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 4, с. 049901 DOI
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  • 2016 Influence of tungsten fiber’s slow drift on the measurement of G with angular acceleration method
  • Jie Luo, Wei-Huang Wu, Chao Xue, Cheng-Gang Shao, Wen-Ze Zhan, Jun-Fei Wu, Vadim Milyukov
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 8, с. 084501 DOI
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  • 2016 Integral electrical characteristics and local plasma parameters of RF ion thruster
  • Masherov P.E., Riaby V.A., Godyak V.A.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 02B926, с. 02B926-1-02B926-3 DOI
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  • 2016 Mixed Pierce-two-stream instability development in an extraction system of a negative ion source
  • Barminova H.Y., Chikhachev A.S.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 2, с. 02A509 DOI
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  • 2016 Modeling of the charge-state separation at ITEP experimental facility for material science based on a Bernas ion source
  • Barminova H.Y., Saratovskyh M.S.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 2, с. 02-914 DOI
• • 2016 Note: Gaussian mixture model for event recognition in optical time-domain reflectometry based sensing systems
  • Fedorov A.K., Anufriev M.N., Zhirnov A.A., Stepanov K.V., Nesterov E.T., Namiot D.E., Karasik V.E., Pnev A.B.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 3 DOI
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  • 2016 Note: Refined Possibilities for Plasma Probe Diagnostics
  • Masherov P.E., Riaby V.A., Abgaryan V.K.
  • в журнале Review of Scientific Instruments, издательство AIP Publishing (United States), том 87, № 086106, с. 086106-1-086106-3 DOI