ИСТИНА

Boyd A.

Соавторы: Achituv Y., Adhikar A.N., Amato S., Anat -.-., Baker D.N., Beer M.A., Claudepierre S.G., Dong S., Erickson P.J., Fennell J.F., Foster J.C., Hawkins-Hooker A., Henderson M.G. показать полностью..., Howell P.G., Hudson M.K., Inoue F., Jaynes A.N., John R.O., Juven-Gershon T., Kanekal S.G., Kenlay H., Kirchner, Kletzing C., Li X., Malaspina D.M., Martin B., Patra A., Reeves G., Shendure J., Shigeki N., Shprits Y.Y., Spence H.E., Thorne R.M., Unger R., Wygant J., Xiong C., Yan Z., Дроздов А.Ю., Кулаковский И.В., Ни В., Пензар Д.Д., Рау Э.И., Сеннов Р.А., Субач Ф.В.

3 статьи

IstinaResearcherID (IRID): 19311723

Деятельность

• Статьи в журналах

  • • 2019 Integration of Multiple Epigenomic Marks Improves Prediction of Variant Impact in Saturation Mutagenesis Reporter Assay
    • Shigaki Dustin, Adato Orit, Adhikar Aashish N., Dong Shengcheng, Hawkins-Hooker Alex, Inoue Fumitaka, Juven-Gershon Tamar, Kenlay Henry, Martin Beth, Patra Ayoti, Penzar Dmitry P., Schubach Max, Xiong Chenling, Yan Zhongxia, Boyle Alan P., Kreimer Anat, Kulakovskiy Ivan V., Reid John, Unger Ron, Yosef Nir, Shendure Jay, Ahituv Nadav, Kircher Martin, Beer Michael A.
    • в журнале Human Mutation, издательство John Wiley & Sons Inc. (United States), № ja DOI
  • • 2014 Gradual Diffusion and Punctuated Phase Space Density Enhancements of Highly Relativistic Electrons: Van Allen Probes Observations
    • Baker D.N., Jaynes A.N., Li X., Henderson M.G., Kanekal S.G., Reeves G.D., Spence H.E., Claudepierre S.G., Fennell J.F., Hudson M.K., Thorne R.M., Foster J.C., Erickson P.J., Malaspina D.M., Wygant J.R., Boyd A., Kletzing C.A., Drozdov A.Y., Shprits Y.Y.
    • в журнале Geophysical Research Letters, издательство American Geophysical Union (United States) DOI
  • • 2001 LIGHT COLLECTION EFFICIENCY AND LIGHT TRANSPORT IN BACKSCATTERED ELECTRON SCINTILLATOR DETECTORS IN SCANNING ELECTRON MICROSCOPY
    • Filippov M.N., Rau E.I., Sennov R.A., Boyde A., Howell P.G.T
    • в журнале Scanning microscopy, издательство Scanning Microscopy International (Chicago Il, United States), том 23, № 5, с. 305